Brand:ZYGO
Model:ZMI-2002
Submodel:8020-0211-1-J
Measurement Range:± 0.01 microns
Resolution:0.001 microns
Accuracy:± 0.005 microns
Operating Temperature Range:-10°C to 50°C
Input Voltage:12V DC
Communication Protocol:RS-485
Weight:0.5 kg
Dimensions:10 x 5 x 2 cm
Certifications:CE, RoHS
The ZYGO ZMI-2002 8020-0211-1-J is an advanced interferometer system designed to meet the stringent requirements of modern metrology applications. This system utilizes state-of-the-art technology to deliver highly accurate measurements in both laboratory and industrial environments. The core design features a robust and compact form factor, making it easy to integrate into various setups without compromising performance.
Key design highlights include its high-resolution capabilities, capable of achieving sub-nanometer resolution, and its unparalleled accuracy which is critical for applications requiring extremely precise measurements. The system employs a 632.8 nm HeNe laser, known for its stability and reliability.
The ZYGO ZMI-2002 8020-0211-1-J supports multiple data output options, including USB, Ethernet, and RS-232, ensuring seamless integration with existing systems and processes. Its compatibility with the comprehensive ZYGO MetroPro software suite enables users to perform complex data analysis and visualization, enhancing the overall efficiency and effectiveness of their metrology tasks.
Constructed from high-quality materials, this system is built to withstand the rigors of industrial use while maintaining optimal performance over time. Whether for semiconductor manufacturing, optics testing, or precision engineering, the ZYGO ZMI-2002 8020-0211-1-J provides unparalleled accuracy and reliability.
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